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Cutting Machine
Magnutom
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Secotom Hot Cell
Accutom
Minitom Hot Cell
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CitoPress
CitoPress Hot Cell
CitoVac
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MAPS
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TargetSystem
Tegramin
AbraPlan
AbraPol
LaboSystem
TegraPol Hot Cell
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TenuPol
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Non Destructive Test
TransPol
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Repliset
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Duramin 4
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StructureExpert
StructureExpert Weld
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SMV-301
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USF-2000
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MST-I
Shimadzu Non Destructive Testing
Fluoroscopic System
SMX-800
Xslicer SMX-1010/-1020
XSlicer SMX-6010
SMX-311M-Fi311M
SMX-3100M-Fi3100M
CT System
SMX-225CT FPD HR
SMX-225CT
SMX-100CT
SMX-90CT
Xseeker 8000
Xdimensus
XDIMENSUS 300
SHIMADZU MAIVIS Ultrasonic Optical Flaw Detector
MIV-X
Shimadzu Dynamic Balancing Machine
Horizontal Type
SGB-STB SERIES
SGF-STF SERIES
S SERIES
M SERIES
HGB-HTB SERIES
HGJ-HTJ SERIES
Vertical Type
VG-VT SERIES
VG2-VT2 SERIES
V SERIES
Shimadzu Scientific Instruments
Optical Emission Spectroscopy
PDA-8000
PDA-7000
PDA-MF Series
X-Ray Fluorescence
EDX-LE/-LE Plus
EDX-7200 / 8100
MXF-2400
X-Ray and Surface Analysis
MAXima_X XRD-7000
EPMA-1720 Series
EPMA-8050G
SPM-8100FM
SPM-9700HT
X-ray Photoelectron Spectroscopy
Kratos AXIS Supra+
AXIS Nova
Ar Gas Cluster Ion Source
ESCApe
Shimadzu Balances
Analytical
AP Series
AT Series
AU Series
AUW-D Series
AW/AW/AY Series
Moisture
MOC63U
MOC-120H
Top Loading
UW/UX SERIES
TW/TWC SERIES
TX/TXB/TXC SERIES
BL SERIES
High-Precision Platfoarm
BW-K/BX-K SERIES
Portable Balances
ELB SERIES
Evident Olympus
Upright Metallurgical Microscopes
BX53M
Inverted Metallurgical Microscopes
GX53
Stereo Microscope
SZ61 / SZ51
SZX16
SZX10
SZX7
Digital Microscopes
DSX1000
Laser Confocal Microscopes
OLS5100
Measuring Microscopes
STM7
Thermal Camera
FLIR AX8
FLIR AX8 Thermal Camera
Seek Thermal
Seek Scan Thermal Camera
Hoytom Pendulum Impact Tester
Hoytom Pendulum Impact Tester
Charpy or Izod
Wikiscan
Wikiscan
Wikiscan
Meiritz Anti Vibration System
AG Series
AG Series
AYA Series
AYA Series
AY-AYN Series
AY-AYN Series
Dumbbell Cutter
SDL-100
SDL-100
SDL-200
SDL-200
SDK Series
SDK-300
SDK-500
SDMP-1000
SDMAK-1000
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Kategori Lain
Shimadzu Scientific Instruments
Optical Emission Spectroscopy
X-Ray Fluorescence
X-Ray and Surface Analysis
X-ray Photoelectron Spectroscopy
Ar Gas Cluster Ion Source
