Sequential X-ray Fluorescence Spectrometer

World-first 250 μm Mapping!

Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and reporting software, the XRF-1800 is a powerful tool for applications in a wide range of industries.


  1. World-first 250 μm mapping for wavelength dispersive analysis (Optional sample observation by CCD camera).
  2. Qualitative/quantitative analysis using higher-order X-rays [Patented]
  3. Film thickness measurement and inorganic component analysis for high-polymer thin films with the background FP method
  4. Smart, small-footprint design (Integrated construction of workstation, X-ray tube cooling system, vacuum pump, X-ray generator, and all other units).
  5. 4 kW thin-window X-ray tube offers high reliability and long life
  6. Tried-and-tested sample loading system [Patented] (Rapid, stable sample transport system offering easy maintenance).
  7. Ultra-fast scanning (300°/min.) for quick and easy qualitative/quantitative analysis
  8. Shimadzu’s expertise condensed into template and matching functions
  9. Full-featured, easy-to-use software